1

Hot carrier degradation for narrow width MOSFET with shallow trench isolation

Year:
2000
Language:
english
File:
PDF, 2.31 MB
english, 2000
13

Hot carrier reliability characteristics of a bend-gate MOSFET

Year:
2000
Language:
english
File:
PDF, 173 KB
english, 2000
33

Masses of the doubly heavy tetraquarks in a constituent quark model

Year:
2019
Language:
english
File:
PDF, 310 KB
english, 2019